G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface This Standard was technically approved

This Standard was technically approved by the Flat Panel Display – Color Global Technical Committee

Floating Zone (FZ) method for single crystal silicon wafers

This Test Method covers the measurement of generation lifetime and generation velocity of silicon wafers

as technology advances to smaller and smaller dimensions for the elements of high density integrated circuits

Refer to SEMI C90 for additional requirements for the use of polymers in LCDS

G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface This Standard was technically approvedglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness