G03500 - SEMI G35 - Specification for Test Methods for Lead Finishes on Semiconductor (Active) Devices Revision:Default Title Wafer Processing:

Wafer Processing:

originally published September 1997

Additions to the Standard are made utilizing the SEMI Standards balloting process

This Standard specifies the physical and electrical interfaces for turbomolecular pump (TMP) type vacuum pumps

or Articles 51 or 80 of the Uniform Fire Code

G03500 - SEMI G35 - Specification for Test Methods for Lead Finishes on Semiconductor (Active) Devices Revision:Default Title Wafer Processing:This specification establishes uniform methods and procedures for conducting tests on lead finishes on (active device) electronic packages. Other SEMI Standards establish materials used and the finishes for them. Referenced SEMI Standards SEMI G4 Integrated Circuit Leadframe Materials Used in the Production of Stamped Leadframes SEMI G18 Integrated Circuit Leadframe Materials Used in the Production of Etched Leadframes SEMI G20 Lead Finishes for