MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance Revision:SEMI MS4-1113 - Superseded 高周波発生器およびマッチング回路

高周波発生器およびマッチング回路

selection of materials or detection systems) are to be used to mitigate fire risk

originally published in 1992

또한 다른 표준(Standards)들과 독립적으로 제공된다

9997% quality

MS00400 - SEMI MS4 - Test Method for Young's Modulus Measurements of Thin, Reflecting Films Based on the Frequency of Beams in Resonance Revision:SEMI MS4-1113 - Superseded 高周波発生器およびマッチング回路The absence of a generally accepted method to determine Youngs modulus has provided a challenge to the microelectromechanical systems (MEMS) community for many years. Without a standard measurement technique, measurements between different laboratories cannot be meaningfully compared. This Standard provides a test method to determine Youngs modulus for thin, reflecting films, based on the average resonance frequency of a single layered cantilever. It