G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法（提案） Revision:SEMI G52-90 (Reapproved 1104) - Superseded The glass substrate is intended

The glass substrate is intended to remain permanently in the package or device

The maintenance of a control chart to monitor the long-term stability of the measurement process is required

製品やレチクルの保護あるいはEMI制御について

all documents cited shall be the latest published versions

This Specification is a first step to standardize the communication between facility and monitoring components

G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法（提案） Revision:SEMI G52-90 (Reapproved 1104) - Superseded The glass substrate is intendedGlobal Assembly and Packaging CommitteeJapanese Packaging Committee2004723Japanese Regional Standards Committee20049www. semi. org2004111990 Na+NH4+K+Cl NO3 Br SO42 PO43 Referenced SEMI Standards None.