P04900 - SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39 Revision:SEMI P49-0823 (Preliminary) - Current This Standard applies to components

This Standard applies to components that are installed in between a substrate and a component in a sandwich or stacked manner

Modules/SIP

The following method has given satisfactory results in determining trace metal impurities at the specified value for each of the target trace metals

Product or reticles

Original Date:         April 26

P04900 - SEMI P49 - Specification for Experimental Curvilinear Multigon Extension to SEMI P39 Revision:SEMI P49-0823 (Preliminary) - Current This Standard applies to componentsNOTICE: This is a Preliminary Standard. Preliminary Standards are approved for publication by a single chapter of a technical global committee for information and comment prior to letter balloting for its adoption as a Full consensus Standard. Preliminary Standards are published for a period of no more than two years, unless a publication extension is granted by the International Standards Committee. This Preliminary Standard will be removed from