Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy • equipment in close proximity

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy • equipment in close proximity1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and