Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 such as titanium

such as titanium

the following technical changes have been made:

This document is not intended for the purpose of taking a decision whether an incident is reportable or not

What is BS EN IEC 60079-19 ‒ Electrical equipment in the explosive atmosphere about

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Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 such as titaniumWhat is this standard about? The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military and aerospace related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of