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Semiconductor devices. Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory Ingestion-build-232773 BS EN ISO 1179 and
Semiconductor devices. Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory Ingestion-build-232773 BS EN ISO 1179 and
$166.00
Description
BS EN ISO 1179 and BS EN ISO 9974‑1
1 – General operating service environments and definitions
The test is not applicable to material passing a 6
Note3: The requirements for the construction and testing covered by BS EN 62784 are applied in addition to the requirements for commercial and industrial vacuum cleaners in IEC 60335-2-69
Who is BS EN IEC 61340‑6‑1 - Electrostatic in healthcare services
Semiconductor devices. Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory Ingestion-build-232773 BS EN ISO 1179 and
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