Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer Ingestion-build-83346 BS ISO 10845-2 establishes

BS ISO 10845-2 establishes

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Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer Ingestion-build-83346 BS ISO 10845-2 establishesWhat is this standard about? This document specifies a method to optimize the mass calibration accuracy in time of flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. It is only applicable to time of flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic