Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 general information to the user

general information to the user

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BS EN ISO 4126-2:2003 Safety devices for protection against excessive pressure

Type of delivery and delivery conditions

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Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 general information to the userWhat is this standard about? This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly distributed pressure to the flexible substrate using the equipment.