Ge Substrate: (100) 10x10 x 0.5 mm , 1SP, P type Ga doped,R:1-5 ohm.cm Battery Analyzer/Cycler Surface roughness: Ra <10A

Surface roughness:  Ra  <10A

such as a fume hood

an Air-tight sample holder will include one zero diffraction plate )

Adhesive (Polyester-polyurethane):  4-5 g/m2                                           (Melting point:  150ºC )

With this testing kit

Ge Substrate: (100) 10x10 x 0.5 mm , 1SP, P type Ga doped,R:1-5 ohm.cm Battery Analyzer/Cycler Surface roughness: Ra <10AGe Wafer Specification Growing Method: CZ Wafer Size: 10 x 10 x0. 5 mm Surface Polishing: one side epi polished Orientation: (100) Surface roughness: RMS or Ra:~ 10 A(By AFM) Doping: Ga doped Conductor type: P type Resistivity: 1 5 Ohms cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Package: under 1000 class clean room in wafer container Related Product Other Crystal